Abstract
In the previous chapter, it was suggested that material/device degradation will occur with time and that this continuing degradation will eventually cause device failure.
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Notes
- 1.
A more detailed discussion of degradation kinetics is found in Chap. 8.
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© 2013 Springer International Publishing Switzerland
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McPherson, J.W. (2013). From Material/Device Degradation to Time-to-Failure. In: Reliability Physics and Engineering. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00122-7_3
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DOI: https://doi.org/10.1007/978-3-319-00122-7_3
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Publisher Name: Springer, Heidelberg
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Online ISBN: 978-3-319-00122-7
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