Skip to main content

Increasing the Reliability of Device/Product Designs

  • Chapter
  • First Online:
Reliability Physics and Engineering
  • 3205 Accesses

Abstract

Design engineers are continually asked reliability questions such as: (1) how long is your newly designed device/product expected to last and (2) how can you make cost-effective design changes to improve the reliability robustness of the device? Often the designer will attempt to answer these questions by stating a safety factor χ which was used for a design.\( \xi_{\text{design}} = \xi_{\text{strength}} /\chi . \)The safety factor, however, is only a qualitative indicator of the reliability margin of the designed device. It states that the designer tried to stay below the expected material’s strength distribution by some safety factor χ. For example, the designer may have used a safety factor of χ = 2.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 79.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 99.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Notes

  1. 1.

    A REF = 2 means that the improved design should last 2 times longer than the original design, a REF = 3 means the improved design should last 3 times longer than the original design, etc.

  2. 2.

    Recall that the stress-level σdesign must be greater than the yield-strength σyield for creep to occur.

  3. 3.

    The value of n creep = 5 is used so often in creep analysis that it is generally referred to as the literature as the five-power-law for creep behavior.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to J. W. McPherson .

Rights and permissions

Reprints and permissions

Copyright information

© 2013 Springer International Publishing Switzerland

About this chapter

Cite this chapter

McPherson, J.W. (2013). Increasing the Reliability of Device/Product Designs. In: Reliability Physics and Engineering. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00122-7_14

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-00122-7_14

  • Published:

  • Publisher Name: Springer, Heidelberg

  • Print ISBN: 978-3-319-00121-0

  • Online ISBN: 978-3-319-00122-7

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics