Abstract
It is very frustrating (and often very costly) to buy a device only to have it to fail with time. However, all devices (from integrated circuits to automobile tires) are fabricated from materials that will tend to degrade with time. The materials degradation will continue until some critical device parameter can no longer meet the required specification for proper device functionality. At this point, one usually says—the device has failed.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2013 Springer International Publishing Switzerland
About this chapter
Cite this chapter
McPherson, J.W. (2013). Introduction. In: Reliability Physics and Engineering. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00122-7_1
Download citation
DOI: https://doi.org/10.1007/978-3-319-00122-7_1
Published:
Publisher Name: Springer, Heidelberg
Print ISBN: 978-3-319-00121-0
Online ISBN: 978-3-319-00122-7
eBook Packages: EngineeringEngineering (R0)