Abstract
The integration of DFT measures is strictly required when designing state-of-the-art ICs to, among others, ensure that a good testability prevails in the resulting design. This testability allows performing high quality manufacturing tests, which give a certain level of confidence that no defects have occurred during the manufacturing process, which potentially tamper the correctness of the functional behavior.
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References
IEEE Standard for Access and Control of Instrumentation Embedded Within a Semiconductor Device, in IEEE Std 1687-2014 (2014), pp. 1–283
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Huhn, S., Drechsler, R. (2021). Conclusion and Outlook. In: Design for Testability, Debug and Reliability. Springer, Cham. https://doi.org/10.1007/978-3-030-69209-4_9
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DOI: https://doi.org/10.1007/978-3-030-69209-4_9
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