Abstract
We review heteroepitaxial growth of Ga\(_2\)O\(_3\) and related alloys by pulsed laser deposition (PLD). First, we briefly summarize the history of PLD and discuss its evolution and development since its breakthrough in the 1980s with the focus on combinatorial material synthesis. Then, the impact of strain on the lattice constant of rhombohedral, pseudomorphic (Al, Ga)\(_2\)O\(_3\) thin films is introduced and the determination of thin film composition from X-ray diffraction measurements is outlined. For monoclinic Ga\(_2\)O\(_3\) layers the influence of key growth parameters on growth rate and surface morphology is discussed. Electrical transport properties of monoclinic thin films doped by silicon or tin are presented and compared to that of homoepitaxial layers. For ternary thin films growth parameters strongly influence the chemical composition in addition to growth rate and morphology. High oxygen pressures and/or low growth temperatures are necessary for a stoichiometric transfer of the target composition to the epilayer which is explained by the desorption of gallium suboxides occurring otherwise. Further, we resume solubility limits and the dependence of structural, optical and vibrational properties on the alloy composition of monoclinic (In, Ga)\(_2\)O\(_3\) and (Al, Ga)\(_2\)O\(_3\) thin films.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
A. Einstein, Phys. Z. 18, 121 (1917)
F. Breech, L. Cross, Appl. Spectrosc. 16, 59 (1962)
H.M. Smith, A.F. Turner, Appl. Opt. 4(1), 147 (1965)
J.T. Cheung, Appl. Phys. Lett. 43(3), 255 (1983)
J.P. Gordon, H.J. Zeiger, C.H. Townes, Phys. Rev. 95(1), 282 (1954)
A.L. Schawlow, C.H. Townes, Phys. Rev. 112(6), 1940 (1958)
T.H. Maiman, Nature 187(4736), 493 (1960)
D. Dijkkamp, T. Venkatesan, X.D. Wu, S.A. Shaheen, N. Jisrawi, Y.H.M. Lee, W.L. McLean, M. Croft, Appl. Phys. Lett. 51(8), 619 (1987)
J.A. Greer, H. Jerrold Van Hook, MRS Proc. 169, 463 (1989)
J.A. Greer, J. Vac. Sci. Technol., A 10(4), 1821 (1992)
J.A. Greer, M.D. Tabat, J. Vac. Sci. Technol., A 13(3), 1175 (1995)
M.D. Strikovsky, E.B. Klyuenkov, S.V. Gaponov, J. Schubert, C.A. Copetti, Appl. Phys. Lett. 63(8), 1146 (1993)
K. Kinoshita, H. Ishibashi, T. Kobayashi, Jpn. J. Appl. Phys. 33(3), L417 (1994)
X.D. Xiang, Mater. Sci. Eng. B 56(2–3), 246 (1998)
A.V. Rode, B. Luther-Davies, E.G. Gamaly, J. Appl. Phys. 85(8), 4222 (1999)
T. Fukumura, M. Ohtani, M. Kawasaki, Y. Okimoto, T. Kageyama, T. Koida, T. Hasegawa, Y. Tokura, H. Koinuma, Appl. Phys. Lett. 77(2), 3426 (2000)
A. Jacquot, M.O. Boffoué, B. Lenoir, A. Dauscher, Appl. Surf. Sci. 156(1–4), 169 (2000)
H.M. Christen, C.M. Rouleau, I. Ohkubo, H.Y. Zhai, H.N. Lee, S. Sathyamurthy, D.H. Lowndes, Rev. Sci. Instrum. 74(9), 4058 (2003)
T. Nobis, E.M. Kaidashev, A. Rahm, M. Lorenz, M. Grundmann, Phys. Rev. Lett. 93, 103903 (2004)
T. Nobis, E.M. Kaidashev, A. Rahm, M. Lorenz, J. Lenzner, M. Grundmann, Nano Lett. 4(5), 797 (2004)
A. Tsukazaki, A. Ohtomo, T. Kita, Y. Ohno, H. Ohno, M. Kawasaki, Science 315(5817), 1388 (2007)
H. von Wenckstern, Z. Zhang, F. Schmidt, J. Lenzner, H. Hochmuth, M. Grundmann, Crystengcomm 15(46), 10020 (2013)
S.S. Mao, X. Zhang, Engineering 1(3), 367 (2015)
A. Inam, M.S. Hegde, X.D. Wu, T. Venkatesan, P. England, P.F. Miceli, E.W. Chase, C.C. Chang, J.M. Tarascon, J.B. Wachtman, Appl. Phys. Lett. 53(10), 908 (1988)
J. Greer, in Pulsed Laser Deposition of Thin Films (John Wiley & Sons Inc, Hoboken, NJ, USA, 2006), pp. 191–213
J.A. Greer, J. Phys. D: Appl. Phys. 47(3), 034005 (2013)
I. Takeuchi, W. Yang, K.S. Chang, M.A. Aronova, T. Venkatesan, R.D. Vispute, L.A. Bendersky, J. Appl. Phys. 94(11), 7336 (2003)
H.M. Christen, S.D. Silliman, K.S. Harshavardhan, Rev. Sci. Instrum. 72(6), 2673 (2001)
Z. Zhang, H. von Wenckstern, M. Grundmann, IEEE, J. Sel. Top. Quantum Electron. 20(6), 106 (2014)
A. Mavlonov, S. Richter, H. von Wenckstern, R. Schmidt Grund, J. Lenzner, M. Lorenz, M. Grundmann, Phys. Status Solidi A 212(12), 2850 (2015)
Z. Zhang, H. von Wenckstern, J. Lenzner, M. Grundmann, Appl. Phys. Lett. 108(24), 243503 (2016)
S. Bitter, P. Schlupp, M. Bonholzer, H. von Wenckstern, M. Grundmann, A.C.S. Comb, Sci. 18(4), 188 (2016)
C. Kranert, J. Lenzner, M. Jenderka, M. Lorenz, H. von Wenckstern, R. Schmidt-Grund, M. Grundmann, J. Appl. Phys. 116(1), 013505 (2014)
H. von Wenckstern, D. Splith, M. Purfürst, Z. Zhang, C. Kranert, S. Müller, M. Lorenz, M. Grundmann, Semicond. Sci. Technol. 30(2), 024005 (2015)
H. von Wenckstern, D. Splith, A. Werner, S. Müller, M. Lorenz, M. Grundmann, A.C.S. Comb, Sci. 17(12), 710 (2015)
V. Prozheeva, R. Hölldobler, H. von Wenckstern, M. Grundmann, F. Tuomisto, J. Appl. Phys. 123(12), 125705 (2018)
C. Kranert, M. Jenderka, J. Lenzner, M. Lorenz, H. von Wenckstern, R. Schmidt-Grund, M. Grundmann, J. Appl. Phys. 117(12), 125703 (2015)
R. Schmidt-Grund, C. Kranert, H. von Wenckstern, V. Zviagin, M. Lorenz, M. Grundmann, J. Appl. Phys. 117(16), 165307 (2015)
M. Lorenz, S. Hohenberger, E. Rose, M. Grundmann, Atomically stepped, pseudomorphic, corundum-phase (Al\(_{1-x}\)Ga\(_x\))\(_2\)O\(_3\) thin films (0 \(\le \, x\,\le \,\) 0.08) grown on r-plane sapphire (2018)
M. Grundmann, J. Zuniga-Pérez, Phys. Status Solidi B 253, 351 (2016)
M. Grundmann, J. Appl. Phys. 124(18), 185302 (2018)
R. Kumaran, T. Tiedje, S.E. Webster, S. Penson, W. Li, Opt. Lett. 35, 3793 (2010)
R.J. Cava, J.M. Phillips, J. Kwo, G.A. Thomas, R.B. van Dover, S.A. Carter, J.J. Krajewski, W.F. Peck, J.H. Marshall, D.H. Rapkine, Appl. Phys. Lett. 64(16), 2071 (1994)
J.M. Phillips, J. Kwo, G.A. Thomas, S.A. Carter, R.J. Cava, S.Y. Hou, J.J. Krajewski, J.H. Marshall, W.F. Peck, D.H. Rapkine, R.B.v. Dover, Appl. Phys. Lett. 65(1), 115 (1994)
M. Orita, H. Ohta, M. Hirano, H. Hosono, Appl. Phys. Lett. 77(25), 4166 (2000)
M. Orita, H. Hiramatsu, H. Ohta, M. Hirano, H. Hosono, Thin Solid Films 411(1), 134 (2002)
M. Grundmann, T. Böntgen, M. Lorenz, Phys. Rev. Lett. 105, 146102 (2010)
M. Grundmann, Phys. Status Solidi B 248(4), 805 (2011)
H. von Wenckstern, Adv. Electron. Mater. 3(9), 1600350 (2017)
S.A. Lee, J.Y. Hwang, J.P. Kim, S.Y. Jeong, C.R. Cho, Appl. Phys. Lett. 89(18), 182906 (2006)
S.L. Ou, D.S. Wuu, Y.C. Fu, S.P. Liu, R.H. Horng, L. Liu, Z.C. Feng, Mater. Chem. Phys. 133(2–3), 700 (2012)
S. Müller, H. von Wenckstern, D. Splith, F. Schmidt, M. Grundmann, Phys. Status Solidi A 211(1), 34 (2014)
F.B. Zhang, K. Saito, T. Tanaka, M. Nishio, Q.X. Guo, J. Cryst. Growth 387, 96 (2014)
F.P. Yu, S.L. Ou, D.S. Wuu, Opt. Mater. Express 5(5), 1240 (2015)
F. Zhang, H. Jan, K. Saito, T. Tanaka, M. Nishio, T. Nagaoka, M. Arita, Q. Guo, Thin Solid Films 578, 1 (2015)
F. Zhang, H. Li, Y.T. Cui, G.L. Li, Q. Guo, AIP Adv. 8(4), 045112 (2018)
K. Matsuzaki, H. Hiramatsu, K. Nomura, H. Yanagi, T. Kamiya, M. Hirano, H. Hosono, Thin Solid Films 496(1), 37 (2006)
P. Vogt, O. Bierwagen, Appl. Phys. Lett. 108(7), 072101 (2016)
R. Wakabayashi, T. Oshima, M. Hattori, K. Sasaki, T. Masui, A. Kuramata, S. Yamakoshi, K. Yoshimatsu, A. Ohtomo, J. Cryst. Growth 424, 77 (2015)
X. Wang, Z. Chen, F. Zhang, K. Saito, T. Tanaka, M. Nishio, Q. Guo, Ceramics International 42(11), 12783 (2016)
S. Müller, Schottky-Kontakte auf Zinkoxid- und \(\beta \)-Galliumoxid-Dünnfilmen: Barrierenformation, elektrische Eigenschaften und Temperaturstabilität. Ph.D. thesis, Universität Leipzig, Leipzig (2016). URL http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-206386
F. Zhang, M. Arita, X. Wang, Z. Chen, K. Saito, T. Tanaka, M. Nishio, T. Motooka, Q. Guo, Appl. Phys. Lett. 109(10), 102105 (2016)
F. Zhang, K. Saito, T. Tanaka, M. Nishio, Q. Guo, J. Mater. Sci.: Mater. Electron. 26(12), 9624 (2015)
K.D. Leedy, K.D. Chabak, V. Vasilyev, D.C. Look, J.J. Boeckl, J.L. Brown, S.E. Tetlak, A.J. Green, N.A. Moser, A. Crespo, D.B. Thomson, R.C. Fitch, J.P. McCandless, G.H. Jessen, Appl. Phys. Lett. 111(1), 012103 (2017)
R. Wakabayashi, K. Yoshimatsu, M. Hattori, A. Ohtomo, Appl. Phys. Lett. 111(16), 162101 (2017)
D.D. Edwards, T.O. Mason, J. Am. Ceram. Soc. 81(12), 3285 (1998)
A.L. Jaromin, D.D. Edwards, J. Am. Ceram. Soc. 88(9), 2573 (2005)
F. Zhang, K. Saito, T. Tanaka, M. Nishio, Q. Guo, Solid State Commun. 186, 28 (2014)
F. Zhang, K. Saito, T. Tanaka, M. Nishio, Q. Guo, J. Alloys Compd. 614, 173 (2014)
F. Zhang, H. Li, M. Arita, Q. Guo, Opt. Mater. Express 7(10), 3769 (2017)
Z. Zhang, H. von Wenckstern, J. Lenzner, M. Lorenz, M. Grundmann, Appl. Phys. Lett. 108(12), 123503 (2016)
X.H. Chen, S. Han, Y.M. Lu, P.J. Cao, W.J. Liu, Y.X. Zeng, F. Jia, W.Y. Xu, X.K. Liu, D.L. Zhu, J. Alloys Compd. 747, 869 (2018)
F. Zhang, K. Saito, T. Tanaka, M. Nishio, M. Arita, Q. Guo, Appl. Phys. Lett. 105(16), 162107 (2014)
Z. Hu, Q. Feng, J. Zhang, F. Li, X. Li, Z. Feng, C. Zhang, Y. Hao, Superlattices Microstruct. 114, 82 (2018)
Acknowledgements
This work was financially supported by the European Social Fund within the Young Investigator Group “Oxide Heterostructures” (SAB 100310460) and partly by Deutsche Forschungsgemeinschaft in the Framework of Sonderforschungsbereich 762 “Functionality of Oxide Interfaces.”
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2020 Springer Nature Switzerland AG
About this chapter
Cite this chapter
von Wenckstern, H., Splith, D., Grundmann, M. (2020). Pulsed Laser Deposition 2. In: Higashiwaki, M., Fujita, S. (eds) Gallium Oxide. Springer Series in Materials Science, vol 293. Springer, Cham. https://doi.org/10.1007/978-3-030-37153-1_15
Download citation
DOI: https://doi.org/10.1007/978-3-030-37153-1_15
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-37152-4
Online ISBN: 978-3-030-37153-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)