Abstract
Structured illumination microscopy /microscope (SIM) is an optical technique that has the capability of enhancing the lateral and axial resolution of a fluorescence widefield microscope.
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Masters, B.R. (2020). Structured Illumination Microscopy. In: Superresolution Optical Microscopy. Springer Series in Optical Sciences, vol 227. Springer, Cham. https://doi.org/10.1007/978-3-030-21691-7_13
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