Skip to main content

Characterization of a Small Electro-Mechanical Contact Using LDV Measurement Techniques

  • Conference paper
  • First Online:
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6

Abstract

Numerically modeling chatter behavior of small electrical components embedded within larger components is challenging. Reduced order models (ROMs) have been developed to assess these components’ chatter behavior in vibration and shock environments. These ROMs require experimental validation to instill confidence that these components meet their performance requirements. While achieving conservative results, experimental validation is required, especially considering that the ROMs neglect the viscous damping effects of the fluid that surrounds these particular components within their system. Dynamic ring-down data of the electrical receptacles in air will be explored and will be assessed as to whether that data provides a validation data set for this ROM. Additional data will be examined in which dynamic ring-down data was taken on the receptacle while submerged in an oil, resulting in a unique experimental setup that should prove as a proof of concept for this type of testing on small components in unique environments.

Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy?s National Nuclear Security Administration under contract DE-NA0003525.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Johnson, K.M.: Characterization of a Small Electro-Mechanical Contact Using Non-conventional Measurement Techniques. University of New Mexico (2017)

    Google Scholar 

  2. Lacayo, R.M.: Title Omitted, SAND2015-1647 (OUO). Sandia National Laboratories, Albuquerque (2015)

    Google Scholar 

  3. Encapsulated PICMA(R) Stack Piezo Actuators, p. 9. PI Ceramic, Lederhose (2016)

    Google Scholar 

  4. Corning, D.: XIAMETER(R) PMX-200 Silicone Fluid 10 CS Safety Data Sheet (2017)

    Google Scholar 

  5. Corning, D.: XIAMETER(R) PMX-200 Silicone Fluid 20 CS Safety Data Sheet (2017)

    Google Scholar 

  6. Mayes, R.L.J.D.D.: A Modal Parameter Extraction Algorithm Using Best-Fit Reciprocal Vectors. Sandia National Laboratories, Albuquerque (1998)

    Google Scholar 

  7. Blecke, J.C.W.M.C.: Title Omitted, SAND2015-2032. Sandia National Laboratories, Albuqerque (2015)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Kelsey M. Johnson .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Society for Experimental Mechanics, Inc.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Johnson, K.M. (2019). Characterization of a Small Electro-Mechanical Contact Using LDV Measurement Techniques. In: Niezrecki, C., Baqersad, J., Di Maio, D. (eds) Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-030-12935-4_5

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-12935-4_5

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-12934-7

  • Online ISBN: 978-3-030-12935-4

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics