Skip to main content

Reducing the Statistical Complexity of EMC Testing: Improvements for Radiated Experiments Using Stochastic Collocation and Bootstrap Methods

  • Chapter
  • First Online:
Uncertainty Modeling for Engineering Applications

Abstract

The assessment of statistics and confidence intervals is deeply linked with electromagnetic compatibility (EMC) and electromagnetic interferences (EMI) issues. Indeed, the evaluation of margins and risks are inherent to EMC/EMI: many standards and/or guidelines require the accurate prediction of mean, standard deviation and/or extreme quantities of interest (voltages, currents, E-/H-fields, S-parameters, impedances …). It is well known that EMC/EMI testing configurations (both considering the devices under test and setups) are, by essence, complex to handle: for instance regarding the increase of frequency bandwidth and the coexistence of multi-physics/multi-scales issues. Although EMC/EMI studies are governed by the management of margins, taking into account the stochastic nature both of inputs and outputs remains a serious bottleneck. This is mostly due to stochastic (identification and characterization of random parameters, number of random variables …) and deterministic (computing and/or measuring costs at design and/or qualification steps) considerations. In order to tackle this problem, many stochastic techniques have been explored by different international groups during the past decade. Among these, this communication will be devoted to the introduction of reduced order models (inputs) and the application of bootstrapping (outputs). The advocated models will be discussed regarding pre- and post-inferences, and they will be applied to numerical and experimental radiated EMC tests; frequency- and time-domain experiments will demonstrate the accuracy and efficiency of these methods comparatively to brute force Monte Carlo approaches for electromagnetic field-to-wire coupling configurations.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

eBook
USD 16.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Nitsch D, Camp M, Sabath F et al (2004) Susceptibility of some electronic equipment to HPEM threats. IEEE Trans Electromagn Compat 46:380–389

    Article  Google Scholar 

  2. Brauer F, Sabath F, Haseborg JL (2009) Susceptibility of IT network systems to interferences by HPEM. IEEE Int Symp Electromagn Compat 237–242

    Google Scholar 

  3. Mora N, Kasmi C, Rachidi F, Hélier M, Darces M (2013) Modeling and measurement of the propagation along low voltage power networks for IEMI studies, Technical report, Feb 2013

    Google Scholar 

  4. Kasmi C (2013) Application de la topologie électromagnétique à la modélisation du réseau énergétique basse tension: étude statistique des perturbations conduites, PhD thesis, UPMC

    Google Scholar 

  5. Parfenov YV, Zdoukhov LN, Radasky WA, Ianoz M (2004) Conducted IEMI threats for commercial buildings. IEEE Trans on Electromagn Compat 46:404–411

    Article  Google Scholar 

  6. Mansson D, Thottappillil R, Backstrom M (2008) Propagation of UWB transients in low-voltage power installation networks. IEEE Trans Electromagn Compat 50:619–629

    Article  Google Scholar 

  7. Gradoni G, Arnaut LR (2010) Generalized extreme-value distributions of power near a boundary inside electromagnetic reverberation chambers. IEEE Trans Electromagn Compat 52(3):506–515

    Article  Google Scholar 

  8. Kasmi C, Hélier M, Darces M, Prouff E (2013) Generalised Pareto distribution for extreme value modelling in electromagnetic compatibility. Electron Lett 49(5):334–335

    Article  Google Scholar 

  9. Larbi M, Besnier P, Pecqueux B (2015) Probability of EMC failure and sensitivity analysis with regard to uncertain variables by reliability methods. IEEE Trans Electromagn Compat 57(2)

    Article  Google Scholar 

  10. Kouassi A, Bourinet JM, Lalléchère S, Bonnet P, Fogli M (2016) Reliability and sensitivity analysis of transmission lines in a probabilistic EMC context. IEEE Trans Electromagn Compat

    Google Scholar 

  11. Sudret B (2007) Uncertainty propagation and sensitivity analysis in mechanical models. Contribution to structural reliability and stochastic spectral methods. French Habilitation (HDR), Clermont-Ferrand, France

    Google Scholar 

  12. Bonnet P, Diouf F, Chauvière C, Lalléchère S, Fogli M, Paladian F (2009) Numerical simulation of a reverberation chamber with a stochastic collocation method. C. R. Phys 10, Approaches Electromagn Compat 54–64

    Article  Google Scholar 

  13. Kroese D, Rubinstein D (2008) Simulation and the Monte Carlo method. Wiley

    Google Scholar 

  14. Efron B, Tibshirani RJ (1993) An introduction to the bootstrap. Chapman and Hall, London

    Book  Google Scholar 

  15. Kasmi C, Hélier M, Darces M, Prouff E (2014) Application of a bootstrapping procedure to the analysis of the conducted propagation of electromagnetic interferences along the power network. Kleinheubach Tagung, Miltenberg, Germany

    Google Scholar 

  16. Babu GJ, Singh K (1983) Inference on means using the bootstrap. Ann Stat 11(9):99–1003

    Article  MathSciNet  Google Scholar 

  17. Zhang Y, Hatzinakos D, Venetsanopoulos AN (1993) Bootstrapping techniques in the estimation of higher-order cumulants from short data records. In: IEEE international conference on acoustics, speech, and signal processing—ICASSP-93, vol 4, pp 200–203, 27–30 Apr 1993

    Google Scholar 

  18. Cucchiarelli A, Velardi P (1999) A statistical technique for bootstrapping available resources for proper nouns classification. In: Proceedings of international conference on information intelligence and systems, 1999, pp 429–435

    Google Scholar 

  19. Harrell F (2001) Regression modeling strategies: with applications to linear models, logistic regression, and survival analysis. Springer

    Google Scholar 

  20. International Electrotechnical Commission (IEC) (2003) IEC 61000-4-21, EMC—Part 4–21: testing and measurement techniques—reverberation chamber test methods

    Google Scholar 

  21. Kasmi C, Lalléchère S, Lopes Esteves J, Girard S, Bonnet P, Paladian F, Prouff E (2016) Stochastic EMC/EMI experiments optimization using resampling techniques. IEEE Trans Electromagn Compat

    Google Scholar 

  22. Lalléchère S, Girard S, Bonnet P, Paladian F (2012) Stochastic approaches for electromagnetic compatibility: a paradigm from complex reverberating enclosures. In: Proceedings of ESA workshop on EMC, Venice, Italy, May 2012

    Google Scholar 

  23. Lalléchère S, Girard S, Bonnet P, Paladian F (2013) Stochastic approaches for electromagnetic compatibility: a paradigm from complex reverberating enclosures. In: ICEAA 2013, Turin, Italy, Sept 2013

    Google Scholar 

  24. Rice J (1995) Mathematical statistics and data analysis, 2nd ed. Duxbury Press, ISBN 0-534-20934-3

    Google Scholar 

  25. IEEE standard method for measuring the shielding effectiveness of enclosures and boxes having all dimensions between 0.1 m and 2 m, 2013

    Google Scholar 

  26. Gagliardi L, Micheli D, Gradoni G, Moglie F, Mariani Primiani V (2015) Coupling between multipath environments through a large aperture. IEEE Antennas Wirel Propag Lett 14:1463–1466

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Sébastien Lalléchère .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Springer Nature Switzerland AG

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Kasmi, C. et al. (2019). Reducing the Statistical Complexity of EMC Testing: Improvements for Radiated Experiments Using Stochastic Collocation and Bootstrap Methods. In: Canavero, F. (eds) Uncertainty Modeling for Engineering Applications. PoliTO Springer Series. Springer, Cham. https://doi.org/10.1007/978-3-030-04870-9_8

Download citation

Publish with us

Policies and ethics