Abstract
Software is an essential tool for the scanning electron microscopist and X-ray microanalyst (SEMXM). In the past, software was an important optional means of augmenting the electron microscope and X-ray spectrometer, permitting powerful additional analysis and enabling new characterization methods that were not possible with bare instrumentation. Today, however, it is simply not possible to function as an SEMXM practitioner without using at least a minimal amount of software. A graphical user interface (GUI) is an integral part of how the operator controls the hardware on most modern microscopes, and in some cases it is the only interface. Even many seemingly analog controls such as focus knobs, magnification knobs, or stigmators are actually digital interfaces mounted on hand-panel controllers that connect to the microscope control computer via a USB interface.
References
Hall M, Frank E, Holmes G, Pfahringer B, Reutemann P, Witten IH (2009) The WEKA data mining software: an update. ACM SIGKDD Explor Newsl 11(1):10–18
Hiner M, Rueden C, Eliceiri K (2016) SCIFIO [Software]. ► http://scif.io
Pietzsch T, Preibisch S, Tomancak P et al (2012) ImgLib2—generic image processing in Java. Bioinformatics 28(22):3009–3011, ► http://imagej.net/ImgLib2
Schindelin J, Arganda-Carreras I, Frise E et al (2012) “Fiji: an open-source platform for biological-image analysis”. Nat Methods 9(7):676–682, ► https://fiji.sc (Note that Fiji is not spelled FIJI)
Schindelin J, Rueden CT, Hiner MC et al (2015) The imageJ ecosystem: an open platform for biomedical image analysis. Mol Reprod Dev 82(7–8):518–529
Schneider CA, Rasband WS, Eliceiri KW (2012) NIH Image to ImageJ: 25 years of image analysis. Nat Methods 9(7):671–675
Zuiderveld K (1994) “Contrast limited adaptive histograph equalization.” graphic gems IV. Academic Press Professional, San Diego, pp 474–485
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Goldstein, J.I., Newbury, D.E., Michael, J.R., Ritchie, N.W.M., Scott, J.H.J., Joy, D.C. (2018). ImageJ and Fiji. In: Scanning Electron Microscopy and X-Ray Microanalysis. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6676-9_13
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DOI: https://doi.org/10.1007/978-1-4939-6676-9_13
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