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Low Voltage Scanning Electron Microscopy (LVSEM) for Improved Surface Characterization of Ocular Implants and Other Prosthetic Devices

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Progress in Biomedical Polymers

Abstract

Surgical manipulation of plastic prostheses with metal instruments may produce surface damage which could compromise the biocompatibility of implants by tissue irritation or increase cellular and pathogen adhesion. However, there are little data concerning such manipulative damage. This paper reports the use of low voltage SEM (LVSEM) for examination of plastic device surfaces before and after normal surgical manipulation. Conventional versus low voltage SEM experiments clearly indicate that standard surgical procedures can produce severe implant surface damage which is not detected by normal SEM. However, LVSEM has been shown to visualize such surface damage readily. These results may have very important implications for improved prosthetic devices, instruments, and implant surgery.

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References

  1. E. P. Goldberg, et al., Materials Res. Soc. Symposium Proc., 110, 355 (1989).

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© 1990 Springer Science+Business Media New York

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Goldberg, E.P., Yalon, M., Longo, W.E. (1990). Low Voltage Scanning Electron Microscopy (LVSEM) for Improved Surface Characterization of Ocular Implants and Other Prosthetic Devices. In: Gebelein, C.G., Dunn, R.L. (eds) Progress in Biomedical Polymers. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0768-4_4

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  • DOI: https://doi.org/10.1007/978-1-4899-0768-4_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-0770-7

  • Online ISBN: 978-1-4899-0768-4

  • eBook Packages: Springer Book Archive

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