Abstract
The wafer scale 2D array ELSA (European Large SIMD Array) is recalled in this paper. Special attention is given to recent layout results and to experiments in the reconfiguration strategy.
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Saucier, G., Patry, J.L., Boubekeur, A., Sanlaville, E. (1990). Practical Experiences in the Design of a Wafer Scale 2-D Array. In: Stapper, C.H., Jain, V.K., Saucier, G. (eds) Defect and Fault Tolerance in VLSI Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9957-6_6
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DOI: https://doi.org/10.1007/978-1-4757-9957-6_6
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