Abstract
This chapter is concerned with the acquisition, display, and interpretation of the various images which can be obtained with the SEM—e.g., secondary electron, backscattered electron, x-ray—and how the modern digital computer can be applied in the process. We will be concerned with all aspects of SEM imaging from the generation of the signal when the electron beam interacts with the specimen surface to the perception and interpretation of this information in the mind of the observer. Indeed, we will view all steps involved as an information channel which has certain imperfections and nonlinearities which must be examined in the context of an SEM application.
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© 1986 Springer Science+Business Media New York
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Newbury, D.E., Joy, D.C., Echlin, P., Fiori, C.E., Goldstein, J.I. (1986). Computer-Aided Imaging and Interpretation. In: Advanced Scanning Electron Microscopy and X-Ray Microanalysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9027-6_5
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DOI: https://doi.org/10.1007/978-1-4757-9027-6_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-9029-0
Online ISBN: 978-1-4757-9027-6
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