Abstract
Errors caused by serious malfunctioning of instruments will generally be discovered because they create unbelievable results. Small deviations are much more difficult to detect. Sections 6.4.2 and 7.6 dealt with aberrant processes taking place at high count rates and discussed preventive measures. The effect of noise, another instrument distortion, has been discussed in Sections 6.4.5 and 7.7.4. Still another deviation from the true results caused by instruments may be introduced by the scaler (see Sect. 2.3.5). The time base (Sect. 11.2.1) which opens and closes the counting gate can be coupled to the line frequency, and fluctuations in this will be reflected in the results obtained.
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References and Notes
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© 1973 Plenum Press, New York
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Krugers, J. (1973). Statistics. In: Krugers, J. (eds) Instrumentation in Applied Nuclear Chemistry. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-1953-5_10
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DOI: https://doi.org/10.1007/978-1-4684-1953-5_10
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