Skip to main content

Introduction

  • Chapter
  • First Online:
Atomic Layer Deposition for Semiconductors

Abstract

Successful use of ALD requires chemical precursors with sufficient volatility, thermal stability, and self-limited reactivity with surfaces. Effective ALD precursors are now known for most non-radioactive elements and many of them are commercially available. This review describes their chemical types, typical properties, and reactivity. Suitable pairs of precursors can deposit some pure elements, oxides of most elements, nitrides of many elements, sulfides, selenides and tellurides of some elements, and phosphides, arsenides, carbides, and fluorides of few elements. The mechanisms of ALD reactions involve the transfer of atoms between precursor vapors and surfaces. The transferred atoms are either hydrogen, oxygen, fluorine, or chlorine.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 139.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 179.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 179.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Reference

  1. Hwang CS (2002) J Appl Phys 92:432

    Google Scholar 

  2. Kim SK, Kim KM, Kim WD, Hwang CS, Jeong J (2004) Appl Phys Lett 85:4112

    Google Scholar 

  3. Kim SK, Choi G-J, Lee SY, Seo M, Lee SW, Han JH, Ahn H-S, Han S, Hwang CS (2008) Adv Mater 20:1429

    Google Scholar 

  4. Kim SK, Lee SW, Han JH, Lee B, Han S, Hwang CS (2010) Adv Func Mater 20:2989

    Google Scholar 

  5. Ahonen M, Pessa M, Suntola T (1980) Thin Solid Films 65:301

    Google Scholar 

  6. Hausmann D, Becker J, Wang S, Gordon RG (2002) Sci 298:402

    Google Scholar 

  7. Seo M, Kim SK, Min Y-S, Hwang CS (2011) J Mater Chem Adv Art 21:18497

    Google Scholar 

  8. Waser R, Dittmann R, Staikov G, Szot K (2009) Adv Mater 21:2632

    Google Scholar 

  9. Shannon CE (1949) Bell Syst Tech J 28:59

    Google Scholar 

  10. Lee M-J, Park Y, Suh D-S, Lee E–H, Seo S, Kim D-C, Jung R, Kang B-S, Ahn S-E, Lee CB, Seo DH, Cha Y-K, Yoo I-K, Kim J-S, Park BH (2007) Adv Mater 19:3919

    Google Scholar 

  11. Oh JH, Park JH, Lim YS, Lee HS, Oh YT, Kim JS, Shin JM, Park JH, Song YJ, Ryoo KC, Lim DW, Park SS, Kim JI, Kim JH, Yu J, Yeung F, Jeong CW, Kong JH, Kang DH, Koh GH, Jeong GT, Jeong HS, Kim K (2006) IEEE Int Electron Devices Meet (IEDM) Tech Dig 1

    Google Scholar 

  12. Waser R (2003) Nanoelectronics and information technology. Introduction to part3, Wiley-VCH, 323

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Cheol Seong Hwang .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2014 Springer Science+Business Media New York

About this chapter

Cite this chapter

Hwang, C.S., Yoo, C.Y. (2014). Introduction. In: Hwang, C. (eds) Atomic Layer Deposition for Semiconductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-8054-9_1

Download citation

Publish with us

Policies and ethics