Abstract
In this chapter PUF testing and specification are described. After a short introduction, the basics to the Hamming distance and the binomial distribution is given. Then, the common parameters that are used to define the performance of PUFs are explained. This includes the mean value, the intra-chip Hamming distance, the inter-chip Hamming distance, the correlation between bits, and the power and energy consumption. By using these parameters, a useful specification of PUF circuits should be possible.
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Notes
- 1.
Binom(n, p, q) → Norm(μ, σ).
- 2.
Without any further processing like preprocessing and post-processing approaches explained in later chapters.
- 3.
Energy is the area under the I/t curve multiplied by the voltage E = ∫ ui dt.
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Böhm, C., Hofer, M. (2013). Testing and Specification of PUFs. In: Physical Unclonable Functions in Theory and Practice. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5040-5_4
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DOI: https://doi.org/10.1007/978-1-4614-5040-5_4
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