Abstract
When the spatial correlation is weak, existing general approaches mentioned in Chaps. 3 and 4 do not work well as the number of correlated variables cannot be reduced too much. Recently, an efficient method was proposed [200] to address this problem. The method is based on simplified gate leakage models and formulates the major computation tasks into matrix–vector multiplications via Taylor’s expansion. It then applies fast numerical methods like the fast multipole method or the precorrected fast Fourier transformation (FFT) method to compute the multiplication. However, this method assumes the gate-level leakage currents are purely log-normal, and the chip-level leakage is also approximated by log-normal distribution, which is not the case as we will show in the chapter. Also it can only give the mean and variances, not the complete distribution of the leakage powers.
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Shen, R., Tan, S.XD., Yu, H. (2012). Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling. In: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-0788-1_5
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