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Scanning Tunneling Microscopy and Atomic Force Microscopy on Charge Density Wave and Related Materials

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Physics and Chemistry of Low-Dimensional Inorganic Conductors

Part of the book series: NATO ASI Series ((NSSB,volume 354))

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Abstract

Since the first real-space observation of charge density waves (CDW) on cleaved surfaces of 1T-TaS2 by means of a low-temperature scanning tunneling microscope (STM) by Coleman et al. [1], many different CDW materials have been studied by STM and related scanning probe methods [2–5]. STM is particularly well suited for the investigation of the local structure of CDW systems because CDW formation is connected with a modification of the conduction electron wave-functions and the local density of states at the Fermi to level which the STM is directly sensitive to. The relative CDW amplitudes as measured by STM therefore reflect the amount of charge transfer into the CDW condensate. However, the absolute STM corrugation amplitudes are usually enhanced by several different mechanisms compared with results obtained by other experimental methods.

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Authors and Affiliations

  1. Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstraße 11, D-20355, Hamburg, Germany

    R. Wiesendanger

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  1. R. Wiesendanger
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Editor information

Editors and Affiliations

  1. CNRS and Institut National Polytechnique de Grenoble, Grenoble, France

    Claire Schlenker

  2. CNRS, Grenoble, France

    Jean Dumas

  3. Rutgers, The State University of New Jersey, Piscataway, New Jersey, USA

    Martha Greenblatt

  4. University of Bayreuth, Bayreuth, Germany

    Sander van Smaalen

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© 1996 Plenum Press, New York

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Wiesendanger, R. (1996). Scanning Tunneling Microscopy and Atomic Force Microscopy on Charge Density Wave and Related Materials. In: Schlenker, C., Dumas, J., Greenblatt, M., van Smaalen, S. (eds) Physics and Chemistry of Low-Dimensional Inorganic Conductors. NATO ASI Series, vol 354. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1149-2_13

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  • DOI: https://doi.org/10.1007/978-1-4613-1149-2_13

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8449-9

  • Online ISBN: 978-1-4613-1149-2

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