Abstract
The success of any quantitative x-ray diffraction (XRD) analytical technique depends upon good control of particle size in the sample, elimination of preferred orientation of particles, and, in the case of the reference intensity method (RIM)1 , 2, the measurement of high-quality reference intensity ratios (ki, or RIR). The method developed in our laboratory eliminates preferred orientation by use of an aerosol suspension technique3 , 4 in which the sample particles are carried vertically into a glass fiber filter5 , 6.
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References
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© 1989 Plenum Press, New York
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Davis, B.L. (1989). Quantitative Reference Intensity Analysis: Methodology and Means for Verification of Results. In: Hašek, J. (eds) X-Ray and Neutron Structure Analysis in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0767-9_2
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DOI: https://doi.org/10.1007/978-1-4613-0767-9_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-8072-9
Online ISBN: 978-1-4613-0767-9
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