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Sobolev Norm and Carrier Transport in Semiconductors

  • Conference paper
Transport in Transition Regimes

Part of the book series: The IMA Volumes in Mathematics and its Applications ((IMA,volume 135))

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Abstract

Sobolev norm in H -2 is used to measure the distance between Maxwellian-like distribution functions and particle sets generated by Direct Simulation Monte Carlo method in bulk silicon. This norm can be used as a criteria to determine the domain of validity of the kinetic/macroscopic approaches.

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Author information

Authors and Affiliations

  1. Dipartimento di Matematica e Informatica, Viale Andrea Doria 6, Catania, Italy, 95125

    Orazio Muscato

Authors
  1. Orazio Muscato
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Editor information

Editors and Affiliations

  1. Laboratoire MIP, Université Paul Sabatier, Toulouse Cedex 4, 31062, France

    Naoufel Ben Abdallah

  2. Department of Mathematics, University of Texas at Austin, Austin, TX, 78712, USA

    Irene M. Gamba

  3. Department of Mathematics, Arizona State University, Tempe, AZ, 85287, USA

    Christian Ringhofer

  4. Angewandte Mathematik, Universität des Saarlandes, Saarbrucken, D-66041, Germany

    Anton Arnold

  5. Department of Mathematics, Indiana University, Bloomington, IN, 47405-5701, USA

    Robert T. Glassey

  6. Laboratoire MIP, Université Paul Sabatier, Toulouse Cedex 4, 31062, France

    Pierre Degond

  7. CSCAMM, University of Maryland, College Park, MD, 20742-4015, USA

    C. David Levermore

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Muscato, O. (2004). Sobolev Norm and Carrier Transport in Semiconductors. In: Abdallah, N.B., et al. Transport in Transition Regimes. The IMA Volumes in Mathematics and its Applications, vol 135. Springer, New York, NY. https://doi.org/10.1007/978-1-4613-0017-5_14

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  • DOI: https://doi.org/10.1007/978-1-4613-0017-5_14

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4612-6507-8

  • Online ISBN: 978-1-4613-0017-5

  • eBook Packages: Springer Book Archive

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