Skip to main content

Thresholding of Wavelet Coefficients as Multiple Hypotheses Testing Procedure

  • Chapter
Wavelets and Statistics

Part of the book series: Lecture Notes in Statistics ((LNS,volume 103))

Abstract

Given noisy signal, its finite discrete wavelet transform is an estimator of signal’s wavelet expansion coefficients. An appropriate thresholding of coefficients for further reconstruction of de-noised signal plays a key-role in the wavelet decomposition/reconstruction procedure. [DJ1] proposed a global threshold\( \lambda = \sigma \sqrt {{2\log n}} \) and showed that such a threshold asymptotically reduces the expected risk of the corresponding wavelet estimator close to the possible minimum. To apply their threshold for finite samples they suggested to always keep coefficients of the first coarse j0 levels.

We demonstrate that the choice of j0 may strongly affect the corresponding estimators. Then, we consider the thresholding of wavelet coefficients as a multiple hypotheses testing problem and use the False Discovery Rate (FDR) approach to multiple testing of [BH1]. The suggested procedure controls the expected proportion of incorrectly kept coefficients among those chosen for the wavelet reconstruction. The resulting procedure is inherently adaptive, and responds to the complexity of the estimated function. Finally, comparing the proposed FDR-threshold with that fixed global of Donoho and Johnstone by evaluating the relative Mean-Square-Error across the various test-functions and noise levels, we find the FDR-estimator to enjoy robustness of MSE-efficiency.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 89.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Benjamini, Y., Hochberg, Y.: Controlling the false discovery rate: a practical and powerful approach to multiple testing. J. Roy. Statist. Soc., Ser.B 57 (1995) 289–300.

    MathSciNet  MATH  Google Scholar 

  2. Daubechies, I.:Ten Lectures on Wavelets. SIAM (1992).

    Google Scholar 

  3. Donoho, D.L., Johnstone, I.M.: Ideal spatial adaption by wavelet shrinkage. Biometrika (to appear).

    Google Scholar 

  4. Donoho, D.L., Johnstone, I.M.: Adapting to unknown smoothness via wavelet shrinkage. J. Am. Stat. Ass (1994) (to appear).

    Google Scholar 

  5. Meyer, Y.: Wavelets and Operators. Cambridge University Press (1992).

    MATH  Google Scholar 

  6. Mallat, S.G.: A theory for multiresolution signal decomposition: the wavelet representation. IEEE Trans. Pattern Recogn. and Machine Intel.11( 1989) 674–693.

    Article  MATH  Google Scholar 

  7. Nason, G.P.: Wavelet regression by cross-validation. Tech. Report 447, Dep. of Stat., Stanford University (1994).

    Google Scholar 

  8. Nason, G.P., Silverman, B.W.: The discrete wavelet transform in S. J. Comp. Graph. Statist.3 (1994) 163–191.

    Google Scholar 

  9. Tukey, J.W.: The philosophy of multiple comparison. Statist. Sci.6 (1991) 100–116.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1995 Springer-Verlag New York

About this chapter

Cite this chapter

Abramovich, F., Benjamini, Y. (1995). Thresholding of Wavelet Coefficients as Multiple Hypotheses Testing Procedure. In: Antoniadis, A., Oppenheim, G. (eds) Wavelets and Statistics. Lecture Notes in Statistics, vol 103. Springer, New York, NY. https://doi.org/10.1007/978-1-4612-2544-7_1

Download citation

  • DOI: https://doi.org/10.1007/978-1-4612-2544-7_1

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-0-387-94564-4

  • Online ISBN: 978-1-4612-2544-7

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics