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Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques

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Scanning Probe Microscopy of Functional Materials

Abstract

Multifrequency measurements in atomic force microscopy (AFM) are one of the main techniques advancing this method. Detection of the AFM probe response at different frequencies enables simultaneous and independent studies of individual constituents of overall tip–sample force and, therefore, begins to empower the advanced compositional mapping and quantitative examination of local mechanical, electromagnetic, and other properties of materials. This chapter describes the practical implementation of multifrequency measurements with a commercial instrument and, particularly, their use in AFM-based electric techniques (electric force microscopy (EFM), Kelvin force microscopy (KFM), and piezoresponse force microscopy (PFM)). One of the peculiarities of the multifrequency approach is multiple choices for a particular type of measurement. This demands a thorough evaluation of different permutations for finding the most sensitive and reliable experimental procedure. In case of EFM and KFM, the evaluation of amplitude modulation and frequency modulation detection of tip–sample electrostatic force during intermittent contact imaging revealed the more precise nature and higher spatial resolution of the frequency modulation studies. This technique has been applied for EFM and KFM imaging of various samples (metals, semiconductors, and organic self-assemblies) that have heterogeneities related to variations of work functions, strength and orientation of molecular dipoles and to a presence of surface charges. The presented results demonstrate the advanced capabilities of multifrequency measurements that are improving the nanoscale characterization of electric properties of materials.

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Acknowledgements

The samples examined in the studies, which are described in this Chapter, were kindly provided by our colleagues:Prof. M. Moeller (RWTU Aachen, Germany), Prof. N. Kotov (University of Michigan, Ann Arbor, USA), Prof. A. Gruverman (University of Nebraska, Lincoln, USA), Prof. M. Cota (University of Campinas, Campinas, Brazil) – to whom we are very thankful.

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  1. Agilent Technologies, 4330 W. Chandler Blvd, Chandler, AZ, 85226, USA

    Sergei Magonov

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  1. Sergei Magonov
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  2. John Alexander
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  3. Shijie Wu
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Correspondence to Sergei Magonov .

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  1. , NanoTransport Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831, Tennessee, USA

    Sergei V. Kalinin

  2. Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, 202 Ferguson Hall 7920, Lincoln, 68588, Nebraska, USA

    Alexei Gruverman

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Magonov, S., Alexander, J., Wu, S. (2010). Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_9

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