Abstract
While the history of soft errors in commercial semiconductor devices spans over three decades, it has only been relatively recently that specifications have been created to standardize the characterization of the effects of alpha particles and neutrons on ICs. Some of the first standards developed for devices used in commercial applications come from one of the premier semiconductor industry standards body, JEDEC, formerly known as Joint Electron Device Engineering Council. The JEDEC JESD89 standards are now widely referenced in most technical publications on soft errors in commercial ICs. This chapter gives an overview of the JEDEC JESD89 series of standards, describes the technical background for their development and details the areas for future improvement.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
JEDEC Online Resource Guide at www.jedec.org.
T.C May and M.H. Woods, “A new physical mechanism for soft-errors in dynamic memories”, Proc.16th Annual Reliability Physics Symp, Apr. 1978, pp. 33–402.
T.C. May and M.H. Woods, “Alpha-particle-induced soft error in dynamic memories”, IEEE Trans. Electron Devices, vol. 26, no. 1, pp. 2–9, Jan. 1979.
C.S. Guenzer, E.A. Wolicki, and R.G. Allas, “Single event upset of dynamic RAMs by neutrons, protons”, IEEE Trans. Nucl. Sci., vol. 26, pp. 5048–5052, Dec. 1979.
J.F. Ziegler, “SRIM 2003,” Nucl. Instrum. Methods, vol. 219–220, pp. 1027–1036, 2004.
K.M. Warren, J.D. Wilkinson, R.A. Weller, B.D. Sierawski, R.A. Reed, M.E. Porter, M.H. Mendenhall, R.D. Schrimpf, and L.W. Massengill, “Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods”, IEEE 46th Annual International Reliability Physics Symposium, Phoenix AZ, May 2008, pp. 473–477.
M.S. Gordon, P. Goldhagen, K.P. Rodbell, T.H. Zabel, H.H.K. Tang, J.M. Clem, and P. Bailey, “Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground”, IEEE Trans Nucl. Sci., vol. 51, no. 6, pp. 3427–3434, Dec. 2004.
ASTM E262-03 Standard method for determining thermal neutron reaction and fluence rates by radioactivation techniques.
A. Dixit, R. Heald, and A. Wood, “Trends from ten years of soft error experimentation”, IEEE Workshop on Silicon Errors in Logic – System Effects, Stanford Univ, CA, March 24–25, 2009. Available online at www.selse.org/Papers/selse5_submission_29.pdf.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Slayman, C. (2011). JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors. In: Nicolaidis, M. (eds) Soft Errors in Modern Electronic Systems. Frontiers in Electronic Testing, vol 41. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6993-4_3
Download citation
DOI: https://doi.org/10.1007/978-1-4419-6993-4_3
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-6992-7
Online ISBN: 978-1-4419-6993-4
eBook Packages: EngineeringEngineering (R0)