Abstract
This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximation used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Further Reading
Some Books on Electron Microscopy
P. R. Buseck, J. M. Cowley and L. Eyring, edit., High-Resolution Transmission Electron Microscopy, Oxford Univ. Press, 1988 [43]
J. J. Bozzola and L. D. Russell, Electron Microscopy, Princ. and Tech. for Biologists, 2nd edit., Jones and Bartlett Pub., 1999 [36]
D. K. Bowen and C. R. Hall, Microscopy of Materials, MacMillan Press, 1975 [35]
M. DeGraf, Intro. to Conventional Transmission Electron Microscopy, Cambridge Univ. Press, 2003 [129]
J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976 [87]
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001 [120]
C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966 [141]
P. W. Hawkes, Electron Optics and the Electron Microscope, Taylor and Francis, 1972 [148]
R. D. Heidenreich, Fundamentals of Transmission Electron Microscopy, Wiley, 1964 [154]
P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, M. J. Whelan, Electron Microscopy of Thin Crystals, second edition, Krieger, 1977 [159]
S. Horiuchi, Fundamentals of High Resolution Transmission Electron Microscopy, North-Holland, 1994 [161]
R. Keyse et al., Intro. to Scanning Transmission Electron Microscopy, Springer, 1998 [193]
G. A. Meek, Practical Electron Microscopy for Biologists, second edition, Wiley, 1976 [240]
L. Reimer, Transmission Electron Microscopy, third edition, Springer-Verlag, 1993 [295]
L. Reimer, Scanning Electron Microscopy, Springer-Verlag, 1985 [294]
J. C. H. Spence, Experimental High-Resolution Electron Microscopy, Oxford University Press, 2003 [330]
D. B. Williams and C. B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science, Plenum Press, 1996 [380]
Some Books on Electron Optics
P. Grivet, Electron Optics, Parts 1 and 2, 2nd english edition, Pergamon, 1972 [135]
P. W. Hawkes and E. Kasper, Principles of Electron Optics, Vol. 1, 2, 3, Academic Press, 1989, 1994 [151,152,153]
P. W. Hawkes (edit.), Aberration-corrected Electron Microscopy, Adv. Imag. and Elect. Phys., vol. 153, Academic Press, 2008 [150]
O. Klemperer and M. E. Barnett, Electron Optics, third edition, Cambridge Univ. Press, 1971 [212]
A. B. El-Kareh and J. C. J. El-Kareh, Electron Beams, Lenses, and Optics, Vol.1,2, Academic Press, 1970 [91]
J. Orloff, Handbook of Charged Particle Optics, 2nd edit., CRC Press, 2009 [276]
A. Septier, editor, Applied Charged Particle Optics, in: Adv. in Electronics and Electron Physics, Vol. 13A, B, Academic Press, 1980 [317]
V. K. Zworykin, G. A. Morton, E. G. Ramberg, J. Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 1945 [394]
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2010 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Kirkland, E.J. (2010). The Transmission Electron Microscope. In: Advanced Computing in Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6533-2_2
Download citation
DOI: https://doi.org/10.1007/978-1-4419-6533-2_2
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-6532-5
Online ISBN: 978-1-4419-6533-2
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)