Abstract
This appendix derives a property of a two-dimensional Fourier transform that can be used to generate the projected atomic potential in two dimensions of a three-dimensional atomic potential.
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Kirkland, E.J. (2010). The Fourier Projection Theorem. In: Advanced Computing in Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6533-2_10
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DOI: https://doi.org/10.1007/978-1-4419-6533-2_10
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Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-6532-5
Online ISBN: 978-1-4419-6533-2
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