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© 2009 Springer Science+Business Media B.V.
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Chang, Kh., Markov, I.L., Bertacco, V. (2009). Bug Trace Minimization. In: Functional Design Errors in Digital Circuits. Lecture Notes in Electrical Engineering, vol 32. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-9365-4_8
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DOI: https://doi.org/10.1007/978-1-4020-9365-4_8
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-9364-7
Online ISBN: 978-1-4020-9365-4
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