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ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response

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Scan Statistics

Part of the book series: Statistics for Industry and Technology ((SIT))

Abstract

An approach using the upper level set (ULS) scan statistic to detect geospatial hotspots along with its software implementation is presented for continuous response. The ULS scan statistic is based on the ULS scan tree. A ULS scan tree is a data structure constructed from response data over a geographic region partitioned into cells. Candidates for hotspots are zones in the region. Each such candidate zone consists of cells that are connected geographically. A ULS scan tree is used to identify candidate zones systematically. Nodes of the ULS scan tree are connected zones. The root (the bottom level) of the ULS scan tree is a zone consisting of the entire region. Zones at the top level (leaf zones) consist of cells with maximal response values. For in-between levels, zones at a given level consist of connected cells with higher response values than zones at a lower level. A suitable likelihood statistic and Monte Carlo analysis are used to determine the significance of zonal nodes as hotspots. The gamma response model is studied in detail. A case study illustrating application of the gamma response model is presented.

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Acknowledgements

The first author acknowledges that this material is based upon work supported by (1) The National Science Foundation under Grant No. 0307010, and (ii) The United States Environmental Protection Agency under Grant No. CR-83059301 and No. R-828684-01. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the agencies.

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© 2009 Birkhäuser Boston, a part of Springer Science+Business Media, LLC

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Patil, G.P., Joshi, S.W., Myers, W.L., Koli, R.E. (2009). ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response. In: Glaz, J., Pozdnyakov, V., Wallenstein, S. (eds) Scan Statistics. Statistics for Industry and Technology. Birkhäuser Boston. https://doi.org/10.1007/978-0-8176-4749-0_12

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