Thermal Instability Mechanism

The following statement should be given prior to the feature presentation of the chapters devoted to transistor failure mechanisms. The purpose of this book is not to serve as e some reference manual with a classified set of external features and peculiarities of transistor failures. On the contrary, the purpose is to establish and clarify major regularities and basic mechanisms in “purified” form in order to give a modern physical interpretation and to enable creation of correspondent physical and mathematical tools for particular analysis. Application experience demonstrates that in most real cases, multiple forms of similar mechanisms are involved rather than multiple mechanisms themselves due to multiple design and technological peculiarities of real devices.