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Topo-distance: Measuring the Difference between Spatial Patterns

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Logics in Artificial Intelligence (JELIA 2000)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 1919))

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Abstract

A framework to deal with spatial patterns at the qualitative level of mereotopology is proposed. The main contribution is to provide formal tools for issues of model equivalence and model similarity. The framework uses a multi-modal language S4u interpreted on topological spaces (rather than Kripke semantics) to describe the spatial patterns. Model theoretic notions such as topological bisimulations and topological model comparison games are introduced to define a distance on the space of all topological models for the language S4u. In the process, a new take on mereotopology is given, prompting for a comparison with prominent systems, such as RCC.

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Author information

Authors and Affiliations

  1. Institute for Logic, Language and Information, and Intelligent Sensory and Information Systems, University of Amsterdam, the Netherlands

    Marco Aiello

Authors
  1. Marco Aiello
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Editor information

Editors and Affiliations

  1. Department of Applied Mathematics, E.T.S.I. Informática, University of Málaga, 29071, Málaga, Spain

    Manuel Ojeda-Aciego  & Inma P. de Guzmán  & 

  2. Intelligent Systems Department, Computer Science Institute, University of Leipzig, Augustusplatz 10-11, 04109, Leipzig, Germany

    Gerhard Brewka

  3. Center for Artificial Intelligence, Department of Computer Science, University of Lisbon, 2825-114, Caparica, Portugal

    Luís Moniz Pereira

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© 2000 Springer-Verlag Berlin Heidelberg

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Aiello, M. (2000). Topo-distance: Measuring the Difference between Spatial Patterns. In: Ojeda-Aciego, M., de Guzmán, I.P., Brewka, G., Moniz Pereira, L. (eds) Logics in Artificial Intelligence. JELIA 2000. Lecture Notes in Computer Science(), vol 1919. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-40006-0_6

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  • DOI: https://doi.org/10.1007/3-540-40006-0_6

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-41131-4

  • Online ISBN: 978-3-540-40006-6

  • eBook Packages: Springer Book Archive

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