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Scanning Probe Microscopy Applied to Ferroelectric Materials

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Applied Scanning Probe Methods III

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Authors and Affiliations

  1. Institute of Solid State Physics, Chernogolovka, 142432, Russia

    Oleg Tikhomirov

  2. INFM, Largo Bruno Pontecorvo 3, 56127, Pisa, Italy

    Oleg Tikhomirov & Massimiliano Labardi

  3. INFM and Dipartimento di Fisica “Entrico Fermi”, Università di Pisa, Largo Bruno Pontecorvo 3, I-56127, Pisa, Italy

    Maria Allegrini

Authors
  1. Oleg Tikhomirov
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  2. Massimiliano Labardi
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  3. Maria Allegrini
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Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, 650 Ackerman Road, Suite 255, Columbus, OH, 43202-1107, USA

    Bharat Bhushan

  2. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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Tikhomirov, O., Labardi, M., Allegrini, M. (2006). Scanning Probe Microscopy Applied to Ferroelectric Materials. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods III. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26910-X_7

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