Abstract
In order to understand the properties of advanced magnetic materials, it is necessary to make clear both their microstructure and magnetic domain structure. Transmission electron microscopes can be utilized for characterization in both microstructure and magnetic domain structure. In the present chapter transmission electron microscopy for observing the magnetic domain structure, i. e., Lorentz microscopy and electron holography are presented. Some analytical methods which are useful for magnetic domain structure analysis are also presented prior to Lorentz microscopy and electron holography.
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Shindo, D., Park, YG. (2006). Lorentz Microscopy and Holography Characterization of Magnetic Materials. In: Liu, Y., Sellmyer, D.J., Shindo, D. (eds) Handbook of Advanced Magnetic Materials. Springer, Boston, MA. https://doi.org/10.1007/1-4020-7984-2_11
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