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SOFT X-RAY EMISSION AND RESONANT INELASTIC X-RAY SCATTERING SPECTROSCOPY

  • Chapter
Handbook of Applied Solid State Spectroscopy

Abstract

X-ray spectroscopy was a key technique to elucidate the atomic structure of matter, starting in the early 20th century through the discovery of X-ray diffraction and the observation that X-rays have characteristic energies for different elements of the periodic system. Later, soft X-ray emission spectroscopy offered an experimental basis for the exploration of the electronic structure of solids. Over the years X-ray spectroscopy has been widely used both for elemental analysis in various applications, and as a method for basic research in physics and chemistry.

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Authors and Affiliations

  1. Department of Physics, Uppsala University, Uppsala, Sweden

    E.J. Nordgren, S.M. Butorin & L.-C. Duda

  2. Lawrence Berkeley National Laboratory, 94720, Berkeley, CA, USA

    J.-H. Guo

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  1. E.J. Nordgren
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  2. S.M. Butorin
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  3. L.-C. Duda
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  4. J.-H. Guo
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  1. University Kurukshetra, India

    D. R. Vij

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Nordgren, E., Butorin, S., Duda, LC., Guo, JH. (2006). SOFT X-RAY EMISSION AND RESONANT INELASTIC X-RAY SCATTERING SPECTROSCOPY. In: Vij, D. (eds) Handbook of Applied Solid State Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/0-387-37590-2_14

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