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Active Leakage Reduction and Multi-Performance Devices

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Leakage in Nanometer CMOS Technologies

Part of the book series: Series on Integrated Circuits and Systems ((ICIR))

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References

  1. J. Tschanz, S. Narendra, Y. Ye, B. Bloechel, S. Borkar, and V. De, “Dynamic sleep transistor and body bias for active leakage power control of microprocessors,” IEEE Journal of Solid-State Circuits, vol. 38, pp. 1838–1845, Nov. 2003.

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© 2006 Springer Science+Business Media, Inc.

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Narendra, S., Tschanz, J., Borkar, S., De, V. (2006). Active Leakage Reduction and Multi-Performance Devices. In: Leakage in Nanometer CMOS Technologies. Series on Integrated Circuits and Systems. Springer, Boston, MA. https://doi.org/10.1007/0-387-28133-9_8

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  • DOI: https://doi.org/10.1007/0-387-28133-9_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-25737-2

  • Online ISBN: 978-0-387-28133-9

  • eBook Packages: EngineeringEngineering (R0)

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