16.4 Summary
The boundary scan standard has become absolutely essential. It is no longer possible to test many of the newer PCBs exclusively with a bed-of-nails tester. It is not possible to test MCMs at all without the boundary scan standard. The standard supports external testing with an ATE, and boundary scan chain reconfiguration as a pattern generator and response compressor for built-in self-testing (BIST.) The standard is beginning to get widespread usage.
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© 2002 Kluwer Academic Publishers
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(2002). Boundary Scan Standard. In: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Frontiers in Electronic Testing, vol 17. Springer, Boston, MA. https://doi.org/10.1007/0-306-47040-3_16
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DOI: https://doi.org/10.1007/0-306-47040-3_16
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-7991-1
Online ISBN: 978-0-306-47040-0
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