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Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging

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Applied Scanning Probe Methods VIII

Part of the book series: Nano Science and Technolgy ((NANO))

Abstract

In this chapter, a thorough investigation of the use of carbon nanotubes as nanoprobes of an atomic forcemicroscope is presented. Because of theirmechanical robustness, their controlled geometry with high aspect ratio, their small size and well-defined chemical composition, carbon nanotubes as probes solve many experimental and modeling problems of local probes methods. Over the last decade, many attempts were dedicated to use of carbon nanotubes as nanoprobes. However, in spite of a large number of works, there are still many questions concerning the proper use of carbon nanotubes, such as the type of more appropriate growth methods and an accurate interpretation of the mechanical properties. We present two growth methods based on chemical vapor deposition: (1) anchoring of multiwalled nanotubes to a commercial Si tip and (2) direct growth of a single-walled nanotube on the tip apex. Control parameters such as radius, length, angle with the sample and anchoring are discussed. The mechanical properties of those nanotubes anchored to the tip aremodeled and experimentally probed by dynamical atomic force microscopy in frequency modulation mode. Most of the nanotube mechanical behavior can be understood with a flexural elasticity and an adhesive force. We particularly focus on evaluation of the nanotube equivalent stiffness and on its adhesion force and energy. We demonstrate that the balance between adhesion and elastic energy can be altered by changing the oscillation amplitude. Finally, the nanotube adhesion to the surface is used to image a heterogeneous sample, demonstrating the ability of the nanotube to be chemically sensitive.

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Author information

Authors and Affiliations

  1. CPMOH, Université Bordeaux 1, 351 Cours de la Libération, 33405, Talence cedex, France

    Sophie Marsaudon, Charlotte Bernard, Jean-Pierre Aimé & Rodolphe Boisgard

  2. Physikalisches Institut, Universität Münster, Wilhelm-Klemm-Straße 10, 48149 , Münster, Germany

    Dirk Dietzel

  3. Research Scientist, Eloret Corp./NASA Ames Research Center, MS 229-1, 94035-1000, Moffett Field, CA , USA

    Cattien V. Nguyen

  4. LEPES, 25 av. des Martyrs, 38042, Grenoble cedex, France

    Anne Marie Bonnot

Authors
  1. Sophie Marsaudon
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  2. Charlotte Bernard
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  3. Dirk Dietzel
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  4. Cattien V. Nguyen
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  5. Anne Marie Bonnot
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  6. Jean-Pierre Aimé
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  7. Rodolphe Boisgard
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, W390 Scott Laboratory, 201W. 19th Avenue, 43210-1142, Columbus, Ohio, USA

    Bharat Bhushan

  2. Institute of Physics, FB 16, University of Münster, Wilhelm-Klemm-Str. 10, 48149, Münster, Germany

    Harald Fuchs

  3. Advanced Institute of Science & Technology, School of Materials Science, 923-1292, Ishikawa, Japan

    Masahiko Tomitori

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Marsaudon, S. et al. (2008). Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging. In: Bhushan, B., Fuchs, H., Tomitori, M. (eds) Applied Scanning Probe Methods VIII. Nano Science and Technolgy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74080-3_4

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