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Modern Developments and Applications in Microbeam Analysis

  • Conference proceedings
  • © 1998

Overview

Editors:
  1. Glyn Love

    1. Centre for Electron Optical Studies, University of Bath, UK

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  2. W. A. Patrick Nicholson

    1. Department of Physics and Astronomy, University of Glasgow, UK

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  3. Aldo Armigliato

    1. Istituto LAMEL, C.N.R., Bologna, Italy

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Part of the book series: Mikrochimica Acta Supplementa (MIKROCHIMICA, volume 15)

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Table of contents (51 papers)

  1. Front Matter

    Pages I-XI
    Download chapter PDF

  2. Recent Developments in Instrumentation for X-Ray Microanalysis

    • Peter J. Statham
    Pages 1-9

  3. High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors

    • L. Strüder, C. Fiorini, E. Gatti, R. Hartmann, P. Holl, N. Krause et al.
    Pages 11-19

  4. Efficiency Calibration of a Si(Li) Detector by EPMA

    • Kurt Röhrbacher, Michael Andrae, Martin Völkerer, Johann Wernisch
    Pages 21-28

  5. Wavelength-Dispersive X-Ray Spectrometry

    • Stephen J. B. Reed
    Pages 29-36

  6. X-Ray Spectrum Processing and Multivariate Analysis

    • John M. Titchmarsh
    Pages 37-47

  7. Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope

    • David B. Williams, Masashi Watanabe, Derrick T. Carpenter
    Pages 49-57

  8. On the Spatial Resolution in Analytical Electron Microscopy

    • Aldo Armigliato, David J. Howard, Roberto Balboni, Stefano Frabboni, Matty R. Caymax
    Pages 59-64

  9. Contamination in Analytical Electron Microscopy and in ALCHEMI

    • János L. Lábár, Miklós Adamik, István Dódony
    Pages 65-71

  10. Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at.% Zn Alloy

    • Paweł Zięba
    Pages 73-76

  11. Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials

    • Goran Dražič, Barbara Malič, Marija Kosec
    Pages 77-82

  12. Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations

    • Marek Faryna, Lidia Lityńska, Krzysztof Haberko, Zbigniew Pędzich, Joanna Babiarz
    Pages 83-86

  13. Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals

    • Vladimir P. Oleshko, Renaat H. Gijbels, Willem A. Jacob, Andre J. Van Daele
    Pages 87-92

  14. Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs

    • Igor Levin, Alexander Berner, Christina Scheu, Harald Muellejans, David G. Brandon
    Pages 93-96

  15. SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation

    • Yongchang Fan, Alexander G. Fitzgerald, Hanchang Xu
    Pages 97-100

  16. Surface Characterisation and Modification of YBCO Thin Films by STM

    • Alexander G. Fitzgerald, Yongchang Fan, Hanchang Xu
    Pages 101-107

  17. Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA

    • Peter Karduck
    Pages 109-123

  18. EPMA Sputter Depth Profiling, Part I: Theory and Evaluation

    • Silvia Richter, Norbert Lesch, Peter Karduck
    Pages 125-131

  19. EPMA Sputter Depth Profiling, Part II: Experiment

    • Norbert Lesch, Silvia Richter, Peter Karduck
    Pages 133-139

  20. Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS

    • Peter Willich, Ulrike Wischmann
    Pages 141-147
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Keywords

About this book

This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen­ tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non­ dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.

Editors and Affiliations

  • Centre for Electron Optical Studies, University of Bath, UK

    Glyn Love

  • Department of Physics and Astronomy, University of Glasgow, UK

    W. A. Patrick Nicholson

  • Istituto LAMEL, C.N.R., Bologna, Italy

    Aldo Armigliato

Bibliographic Information

  • Book Title: Modern Developments and Applications in Microbeam Analysis

  • Editors: Glyn Love, W. A. Patrick Nicholson, Aldo Armigliato

  • Series Title: Mikrochimica Acta Supplementa

  • DOI: https://doi.org/10.1007/978-3-7091-7506-4

  • Publisher: Springer Vienna

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Wien 1998

  • Softcover ISBN: 978-3-211-83106-9Published: 20 July 1998

  • eBook ISBN: 978-3-7091-7506-4Published: 06 December 2012

  • Series ISSN: 0076-8642

  • Edition Number: 1

  • Number of Pages: XI, 392

  • Topics: Characterization and Evaluation of Materials, Analytical Chemistry

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