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Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

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Abstract

The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-µm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 µm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 µm, which is a favorable characteristics for various microwave applications.

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Authors and Affiliations

  1. Department of Applied Physics, Fukuoka University, 8-19-1 Nanakuma, Jonan-ku, Fukuoka, 814-0180, Japan

    Kazuto Yamanoi & Takashi Manago

  2. Advanced Electronics Research Division, INAMORI Frontier Research Center, Kyushu University, 744 Motooka, Fukuoka, 819-0395, Japan

    Satoshi Yakata & Takashi Kimura

Authors
  1. Kazuto Yamanoi
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  2. Takashi Manago
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  3. Satoshi Yakata
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  4. Takashi Kimura
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Correspondence to Takashi Manago.

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Yamanoi, K., Manago, T., Yakata, S. et al. Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer. Journal of the Korean Physical Society 63, 800–803 (2013). https://doi.org/10.3938/jkps.63.800

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  • DOI: https://doi.org/10.3938/jkps.63.800

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