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Morphology and properties of ZnO films obtained by repeated spin coating on porous silicon substrates

  • Proceedings of the VIII (XIII) International Seminar on the Physics of Ferroelastics
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Layers of porous silicon (PS), multilayered ZnO films, and heterostructures based on them are obtained. The surface morphology, chemical and phase composition of the PS layers and ZnO films, and the transverse cleavage of ZnO–PS nanocomposite, are investigated via energy-dispersive X-ray spectral analysis (EDX), X-ray diffraction (XRD), and scanning electron microscopy (SEM). The current–voltage characteristics of Al/Ag/p-Si(100)/PS/ZnO/Ag/Al and Al/Ag/p-Si(100)/PS/ZnO/SiC/Ag/Al heterostructures are studied.

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Correspondence to V. S. Zakhvalinskii.

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Original Russian Text © V.S. Zakhvalinskii, I.M. Golev, L.V. Borisenko, T.V. Prokopova, A.N. Khmara, E.A. Pilyuk, D.A. Kolesnikov, 2016, published in Izvestiya Rossiiskoi Akademii Nauk, Seriya Fizicheskaya, 2016, Vol. 80, No. 9, pp. 1218–1221.

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Zakhvalinskii, V.S., Golev, I.M., Borisenko, L.V. et al. Morphology and properties of ZnO films obtained by repeated spin coating on porous silicon substrates. Bull. Russ. Acad. Sci. Phys. 80, 1115–1118 (2016). https://doi.org/10.3103/S1062873816090495

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  • DOI: https://doi.org/10.3103/S1062873816090495

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