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Simulation and analysis of images using spectral characteristics

  • Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Methods intended for the analysis and simulation of microstructure images using integral spectral characteristics of orthogonal transformations are proposed. The described methods, algorithms, and software tools allow the primary processing of such images, along with identifying the correlation spectrum characteristics of microstructures and eliminating distortions related to smearing, blurring, and defocusing.

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References

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Authors and Affiliations

  1. Far East State University, Vladivostok, 690950, Russia

    B. N. Grudin, V. S. Plotnikov, E. V. Pustovalov, N. A. Smolyaninov & S. V. Polishuk

Authors
  1. B. N. Grudin
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  2. V. S. Plotnikov
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  3. E. V. Pustovalov
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  4. N. A. Smolyaninov
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  5. S. V. Polishuk
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Corresponding author

Correspondence to B. N. Grudin.

Additional information

Original Russian Text © B.N. Grudin, V.S. Plotnikov, E.V. Pustovalov, N.A. Smolyaninov, S.V. Polishuk, 2012, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2012, Vol. 76, No. 9, pp. 1134–1139.

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Grudin, B.N., Plotnikov, V.S., Pustovalov, E.V. et al. Simulation and analysis of images using spectral characteristics. Bull. Russ. Acad. Sci. Phys. 76, 1020–1024 (2012). https://doi.org/10.3103/S1062873812090079

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  • DOI: https://doi.org/10.3103/S1062873812090079

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