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Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission

  • Nanomaterials, Ceramics
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Abstract

X-ray diffraction, Raman spectroscopy and Optical absorption estimates of the thickness of graphene multi layer stacks (number of graphene layers) are presented for three different growth techniques. The objective of this work was focused on comparison and reconciliation of the two already widely used methods for thickness estimates (Raman and Absorption) with the calibration of the X-ray method as far as Scherer constant K is concerned and X-ray based Wagner-Aqua extrapolation method.

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Authors and Affiliations

  1. Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681, Warsaw, Poland

    M. Tokarczyk, G. Kowalski, H. Kępa, K. Grodecki & A. Drabińska

  2. Institute of Electronic Materials Technology, Wólczyńska 133, 01-919, Warsaw, Poland

    K. Grodecki & W. Strupiński

Authors
  1. M. Tokarczyk
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  2. G. Kowalski
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  3. H. Kępa
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  4. K. Grodecki
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  5. A. Drabińska
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  6. W. Strupiński
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Corresponding author

Correspondence to M. Tokarczyk.

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Tokarczyk, M., Kowalski, G., Kępa, H. et al. Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission. Crystallogr. Rep. 58, 1053–1057 (2013). https://doi.org/10.1134/S1063774513070195

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  • DOI: https://doi.org/10.1134/S1063774513070195

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