Measurements of two neighbouring silicon-based qubits show that the charge noise they each experience is correlated, suggesting a common origin. Understanding these correlations is crucial for performing error correction in these systems.
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References
Burkard, G., Ladd, T. G., Pan, A., Nichol, J. M. & Petta, J. R. Rev. Mod. Phys. 95, 025003 (2023).
Gonzalez-Zalba, M. F. et al. Nat. Electron. 4, 872–884 (2021).
Zwerver, A. M. J. et al. Nat. Electron. 5, 184–190 (2022).
Yoneda, J. et al. Nat. Phys. https://doi.org/10.1038/s41567-023-02238-6 (2023).
Noiri, A. et al. Nature 601, 338–342 (2022).
Xue, X. et al. Nature 601, 343–347 (2022).
Connors, E. J., Nelson, J., Edge, L. F. & Nichol, J. M. Nat. Commun. 13, 940 (2022).
Struck, T. et al. npj Quantum Inf. 6, 40 (2020).
Boter, J. M. et al. Phys. Rev. B 101, 235133 (2020).
Wuetz, B. P. et al. Nat. Commun. 14, 1385 (2023).
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Cywiński, Ł. Spatial correlations of charge noise captured. Nat. Phys. 19, 1751–1752 (2023). https://doi.org/10.1038/s41567-023-02189-y
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DOI: https://doi.org/10.1038/s41567-023-02189-y
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