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Standardizing flat lens characterization

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The field of flat lens research brings innovative nanophotonic design concepts to the world of macro-optics. However, when evaluating the performance of these lenses a lack of consistency prevents proper comparison of competing technologies. This problem can be solved by using methods developed in industry for conventional lenses.

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Fig. 1: PSF measurement.

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Authors and Affiliations

  1. Department of Applied Physics, The Faculty of Science, The Center for Nanoscience and Nanotechnology, The Hebrew University, Jerusalem, Israel

    Jacob Engelberg & Uriel Levy

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  1. Jacob Engelberg
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  2. Uriel Levy
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Correspondence to Uriel Levy.

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Engelberg, J., Levy, U. Standardizing flat lens characterization. Nat. Photon. 16, 171–173 (2022). https://doi.org/10.1038/s41566-022-00963-7

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