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Fault tolerance in the brain

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If stored information is erased from neural circuits in one brain hemisphere in mice, the lost data can be recovered from the other. This finding highlights a safeguarding mechanism at work in the brain. See Article p.459

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Figure 1: A mechanism of redundancy.

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References

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Authors and Affiliations

  1. Byron M. Yu is in the Department of Electrical and Computer Engineering and the Department of Biomedical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA.,

    Byron M. Yu

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  1. Byron M. Yu
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Correspondence to Byron M. Yu.

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Yu, B. Fault tolerance in the brain. Nature 532, 449–450 (2016). https://doi.org/10.1038/nature17886

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