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Materials science

Boosting X-ray emission

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A spectroscopic technique has been demonstrated that uses stimulated emission to enhance weak X-ray signals for fundamental studies in materials science. See Letter p.191

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Figure 1: RIXS spectroscopy using stimulated emission.

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Correspondence to Ernst Fill.

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Fill, E. Boosting X-ray emission. Nature 501, 172–173 (2013). https://doi.org/10.1038/501172a

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