Abstract
A STUDY of the distribution of elements in inhomogeneous samples has assisted many chemical and metallurgical investigations, and in particular the electron probe microanalyser has proved a valuable tool for examining small areas at high resolution. In certain cases, however, a less costly analytical instrument of lower resolution is required for scanning larger areas, and for this purpose an X-ray milliprobe analyser has been designed, using a collimated beam of X-rays 1 mm in diameter1.
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References
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PIERCE, T., PECK, P. & CUFF, D. Examination of Surfaces by scanning with Charged Particles. Nature 211, 66–67 (1966). https://doi.org/10.1038/211066a0
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DOI: https://doi.org/10.1038/211066a0
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