Abstract
IN the 'absolute measurements' of X-ray intensities of reflexions from a crystal, a measurement must be made of the monochromatic radiation incident upon the crystal in one second1, which, though it can be done fairly conveniently by the ionization chamber method2, requires a complicated design of apparatus in the use of the rotation photographic method. I have considered the problem in the light of a new synthesis of X-ray data3 and found that the absolute values of |F (h)| 2 may be deduced to a close approximation from the relative intensity data without any further experimental work. The derivation of the equations needed in this deduction in the case of a linear crystal is shown below.
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References
Bragg, W. L., "The Crystalline State", 1, 219.
Compton, A. H., Phys. Rev., 9, 29 (1917).
Yü, NATURE, 149, 638 (1942).
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YÜ, S. Determination of Absolute from Relative X-Ray Intensity Data. Nature 150, 151–152 (1942). https://doi.org/10.1038/150151b0
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DOI: https://doi.org/10.1038/150151b0
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