Nano Research

, Volume 2, Issue 9, pp 671–677

Magnetoresistance oscillations of ultrathin Pb bridges

Authors

    • Institute of PhysicsChinese Academy of Sciences
    • The Center for Nanoscale Science and Department of PhysicsThe Pennsylvania State University
  • Xucun Ma
    • Institute of PhysicsChinese Academy of Sciences
  • Shuaihua Ji
    • Institute of PhysicsChinese Academy of Sciences
  • Yun Qi
    • Institute of PhysicsChinese Academy of Sciences
  • Yingshuang Fu
    • Institute of PhysicsChinese Academy of Sciences
  • Aizi Jin
    • Institute of PhysicsChinese Academy of Sciences
  • Li Lu
    • Institute of PhysicsChinese Academy of Sciences
  • Changzhi Gu
    • Institute of PhysicsChinese Academy of Sciences
  • X. C. Xie
    • Institute of PhysicsChinese Academy of Sciences
    • Department of PhysicsOklahoma State University
  • Mingliang Tian
    • The Center for Nanoscale Science and Department of PhysicsThe Pennsylvania State University
  • Jinfeng Jia
    • Institute of PhysicsChinese Academy of Sciences
    • Department of PhysicsTsinghua University
    • Institute of PhysicsChinese Academy of Sciences
    • Department of PhysicsTsinghua University

DOI: 10.1007/s12274-009-9070-3

Abstract

Pb nanobridges with a thickness of less than 10 nm and a width of several hundred nm have been fabricated from single-crystalline Pb films using low-temperature molecular beam epitaxy and focus ion beam microfabrication techniques. We observed novel magnetoresistance oscillations below the superconducting transition temperature (T C ) of the bridges. The oscillations—which were not seen in the crystalline Pb films—may originate from the inhomogeneity of superconductivity induced by the applied magnetic fields on approaching the normal state, or the degradation of film quality by thermal evolution.

https://static-content.springer.com/image/art%3A10.1007%2Fs12274-009-9070-3/MediaObjects/12274_2009_9070_Fig1_HTML.jpg

Keywords

Pb nanobridge magnetoresistance superconductivity molecular beam epitaxy scanning tunneling microscope focus ion beam

Copyright information

© Tsinghua University Press and Springer Berlin Heidelberg 2009