Abstract
This paper proposes a circuit compatible model for electrostatic doped Schottky barrier carbon nanotube field effect transistor (ED-SBCNTFET). The proposed model is an extension of the Schottky barrier carbon nanotube field effect transistor (SBCNTFET) to ED-SBCNTFET by adding polarity gates, which are used to create electrostatic doping. In ED-SBCNTFET, electrostatic doping is responsible for a fermi level shift of source and drain regions. A mathematical relation has been developed between fermi level shift and polarity gate bias. Both current–voltage (I–V) and capacitance–voltage (C–V) characteristics have been efficiently modeled. The results are compared with the reported semi-classical model and simulations from NanoTCAD ViDES for validation. The proposed model is much faster than numerical models as it denies self consistent equations. Finally, circuit application is demonstrated by simulating inverter using the proposed model in HSPICE.
Similar content being viewed by others
References
International Technology Roadmap for Semiconductors (ITRS), Emerging Research Devices Summary (2013).http://public.itrs.net/ITRS%201999-2014%20Mtgs%20Presentations%20&%20Links/2013ITRS/2013Chapters/2013ExecutiveSummary.pdf. Accessed 2 Dec 2014.
Y.-B. Kim, Trans. Electr. Electron. Mater. 10, 93 (2009).
H. Iwai, Microelectron. Eng. 86, 1520 (2009).
J. Wu, Y.-L. Shen, K. Reinhardt, H. Szu, and B. Dong, in Proceedings of the Applied Computational Intelligence and Soft Computing, (2013), pp. 113.
M.S. Dresselhaus, G. Dresselhaus, and R. Saito, Carbon 33, 883 (1995).
H. Li, W.-Y. Yin, K. Banerjee, and J.-F. Mao, IEEE Tran. Electron. Devices 55, 1328 (2008).
K. Singh and B. Raj, J. Electron. Mater. 44, 4825 (2015).
Y.M. Lin, J. Appenzeller, J. Knoch, and P. Avouris, IEEE Trans. Nanotechnol. 4, 481 (2005).
J. Ali, J. Guo, Q. Wang, M. Lundstrom, and H. Dai, Nature 424, 654 (2003).
Z. Yao, C.L. Kane, and C. Dekker, Phys. Rev. Lett. 84, 2941 (2000).
S. Fregonese, H. Cazin d’Honincthun, J. Goguet, C. Maneux, T. Zimmer, J.-P. Bourgoin, P. Dollfus, and S. Galdin-Retailleau, IEEE Trans. Electron Devices 55, 1317 (2008).
J. Appenzeller, Y.-M. Lin, J. Knoch, Z. Chen, and P. Avouris, IEEE Trans. Electron Devices 52, 2568 (2005).
A. Javey, H. Kim, M. Brink, Q. Wang, A. Ural, J. Guo, P. McIntyre, P. McEuen, M. Lundstrom, and H. Dai, Nat. Mater. 1, 241 (2002).
A. Rahman, J. Guo, S. Datta, and M.S. Lundstrom, IEEE Trans. Electron Devices 50, 1853 (2003).
G. Fiori, and G. Iannaccone, NanoTCAD ViDES (2008).
X. Yang and K. Mohanram, IEEE Electron Device Lett. 32, 231 (2011).
J. Knoch and M.R. Muller, IEEE Trans. Nanotechnol. 13, 1044 (2014).
S. Iijima, Nature 354, 56 (1991).
A. Javey, R. Tu, D. Farmer, J. Guo, R. Gordon, and H. Dai, Nano Lett. 5, 345 (2005).
M. Najari, S. Fregonese, C. Maneux, H. Mnif, N. Masmoudi, and T. Zimmer, IEEE Trans. Electron Devices 58, 195 (2011).
J. Guo, M. Lundstrom, and S. Datta, Appl. Phys. Lett. 80, 3192 (2002).
J. Knoch and J. Appenzeller, Phys. Status Solidi (A) 205, 679 (2008).
J. Knoch, and J. Appenzeller, in Proceedings of the AmIware Hardware Technology Drivers of Ambient Intelligence, (Springer Netherlands, 2006), pp. 371–402.
R. Yan, A. Ourmazd, and K. Lee, IEEE Trans. Electron Devices 39, 1704 (1992).
D.S. Hien, N.T. Luong, T.T.A. Tuan, and D.V. Nga, J. Phys: Conf. Ser. 187, 012061 (2009).
Y. Xuebei, G. Fiori, G. Iannaccone, and K. Mohanram, in 20th Symposium on Great Lakes Symposium on VLSI, pp. 233–238 (2010).
A. Raychowdhury, S. Mukhopadhyay, and K. Roy, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23, 1411 (2004).
J.W. Mintmire and C.T. White, Phys. Rev. Lett. 81, 2506 (1998).
H. Abebe, Electrostatic Single-walled Carbon Nanotube (CNT) Field Effect Transistor Device Modeling. (2004). http://www.techconnectworld.com/Microtech2011/program/pdf/WCM2011-HAbebe.pdf. Accessed 25 August 2015.
B.G. Streetman, and S. Banerjee, Solid State Electronics Devices, 6th ed. (Prentice Hall, India, 2000) pp. 89–92.
J.M.M. Prado, Current transport modeling of carbon nanotube field effect transistors for analysis and design of integrated circuits, PhD dissertation, Louisiana State University, Baton Rouge (2008).
NANOHUB Simulations (2014). https://nanohub.org/tools/vides. Accessed 27 Oct 2015.
S.K. Sinha and S. Chaudhury, IEEE Trans. Nanotechnol. 12, 958 (2013).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Singh, A., Khosla, M. & Raj, B. Circuit Compatible Model for Electrostatic Doped Schottky Barrier CNTFET. J. Electron. Mater. 45, 5381–5390 (2016). https://doi.org/10.1007/s11664-016-4743-7
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-016-4743-7