Journal of Electronic Materials

, Volume 38, Issue 8, pp 1548–1553

Growth of Thick Epitaxial CdTe Films by Close Space Sublimation

  • Q. Jiang
  • A. W. Brinkman
  • B. J. Cantwell
  • J. T. Mullins
  • Fabrice Dierre
  • A. Basu
  • P. Veeramani
  • P. Sellin
Article

DOI: 10.1007/s11664-009-0808-1

Cite this article as:
Jiang, Q., Brinkman, A.W., Cantwell, B.J. et al. Journal of Elec Materi (2009) 38: 1548. doi:10.1007/s11664-009-0808-1

This paper reports on a detailed study of the development of the close space sublimation method, which has been widely used in the preparation of polycrystalline CdTe/CdS solar cells, as an epitaxial method for the growth of thick CdTe single crystal films over 200 μm on GaAs and Ge substrates for high-energy radiation detectors. The resulting microscopic growth phenomena in the process are also discussed in this paper. High-quality single crystalline CdTe thick films were prepared with x-ray rocking curves full width at half maximum (FWHM) values, which were ∼100 arcsec on Ge substrates and 300 arcsec on GaAs substrates. The quality of thick films on Ge(100) showed a substantial improvement with nucleation in a Te-rich growth environment. No Te inclusions in the CdTe films grown on GaAs(211)B and Ge(100) were observed with IR transmission imaging. Photoluminescence of CdTe/Ge shows a large reduction in the 1.44 eV defect energy bands compared with films grown on GaAs substrates. The film resistivity is on the order of 1010 Ω cm, and the film displayed some sensitivity to alpha particles.

Key words

CdTe detector epitaxy thick film 

Copyright information

© TMS 2009

Authors and Affiliations

  • Q. Jiang
    • 1
  • A. W. Brinkman
    • 1
  • B. J. Cantwell
    • 2
  • J. T. Mullins
    • 2
  • Fabrice Dierre
    • 2
  • A. Basu
    • 2
  • P. Veeramani
    • 3
  • P. Sellin
    • 3
  1. 1.Department of PhysicsDurham UniversityDurhamUK
  2. 2.KromekSedgefieldUK
  3. 3.Physics DepartmentUniversity of SurreyGuildfordUK

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