Skip to main content
Log in

Temperature programmed desorption of F-doped SnO2 films deposited by inverted pyrosol technique

  • Published:
Journal of Thermal Analysis and Calorimetry Aims and scope Submit manuscript

Abstract

Fluorine-doped tin dioxide (FTO) films were deposited on silicon wafers by inverted pyrosol technique using solutions with different doping concentration (F/Sn=0.00, 0.12, 0.75 and 2.50). The physical and electrical properties of the deposited films were analyzed by SEM, XRF, resistivity measurement by four-point-probe method and Hall coefficient measurement by van der Pauw method. The electrical properties showed that the FTO film deposited using the solution with F/Sn=0.75 gave a lowest resistivity of 3.2·10–4 ohm cm. The FTO films were analyzed by temperature programmed desorption (TPD). Evolved gases from the heated specimens were detected using a quadruple mass analyzer for mass fragments m/z, 1(H+), 2(H2 +), 12(C+), 14(N+), 15(CH3 +), 16(O+), 17(OH+ or NH3 +), 18(H2O+ or NH4 +), 19(F+), 20(HF+), 28(CO+ or N2 +), 32(O2 +), 37(NH4F+), 44(CO2 +), 120(Sn+), 136(SnO+) and 152(SnO2 +). The majority of evolved gases from all FTO films were water vapor, carbon monoxide and carbon dioxide. Fluorine (m/z 19) was detected only in doped films and its intensity was very strong for highly-doped films at temperature above 400°C.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. S. Aukkaravittayapun, Thai Patent, filed No. 098821, 22 March, 2005.

  2. R Pommier C Gril J Marucchi (1981) Thin Solid Films 77 91 Occurrence Handle1:CAS:528:DyaL3MXhsValtL0%3D Occurrence Handle10.1016/0040-6090(81)90363-1

    Article  CAS  Google Scholar 

  3. C Agashe MG Takwale BR Marathe VG Bhide (1988) Sol. Energy Mater. 17 99 Occurrence Handle1:CAS:528:DyaL1cXhsFelsrc%3D Occurrence Handle10.1016/0165-1633(88)90010-X

    Article  CAS  Google Scholar 

  4. H Haitjema JJPh Elich CJ Hoogendoorn (1989) Sol. Energy Mater. 18 283 Occurrence Handle1:CAS:528:DyaL1MXktFShsb0%3D Occurrence Handle10.1016/0165-1633(89)90043-9

    Article  CAS  Google Scholar 

  5. Y Sawada S Seki M Sano N Miyabayashi K Ninomiya A Iwasawa T Tsugoshi R Ozao Y Nishimoto (2004) J. Therm. Anal. Cal. 77 751 Occurrence Handle1:CAS:528:DC%2BD2cXnsFOktL8%3D Occurrence Handle10.1023/B:JTAN.0000041654.30854.2f

    Article  CAS  Google Scholar 

  6. S Seki T Aoyama Y Sawada M Ogawa M Sano N Miyabayashi H Yoshida Y Hoshi M Ide A Shida (2002) J. Therm. Anal. Cal. 69 1021 Occurrence Handle1:CAS:528:DC%2BD38XnvVyjt7c%3D Occurrence Handle10.1023/A:1020649232003

    Article  CAS  Google Scholar 

  7. G Blandenet M Court Y Lagarde (1981) Thin Solid Films 77 81 Occurrence Handle1:CAS:528:DyaL3MXhs1Gnu78%3D Occurrence Handle10.1016/0040-6090(81)90362-X

    Article  CAS  Google Scholar 

  8. NIST database No. 4.

  9. NIST database No. 36.

  10. NIST database No. 8.

  11. NIST database No. 1.

  12. NIST database No. 10.

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Aukkaravittayapun S..

Rights and permissions

Reprints and permissions

About this article

Cite this article

Aukkaravittayapun, S., Thanachayanont, C., Theapsiri, T. et al. Temperature programmed desorption of F-doped SnO2 films deposited by inverted pyrosol technique. J Therm Anal Calorim 85, 811–815 (2006). https://doi.org/10.1007/s10973-006-7556-8

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10973-006-7556-8

Keywords

Navigation