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Effect of Artificial Defects on Electric and Magnetic Transport Properties in YBa2Cu3O7−δ Thick Film

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Abstract

The effect of 200 MeV Ag ions on YBa2Cu3O7−δ /5 wt.% Y2O3 composite thick films is studied. The structural deformity is analysed with X-ray diffraction showing reduced peak intensity. The decrease of transition temperature as a function of ion fluence has been observed from temperature-dependent resistivity and magnetization measurement. Fluctuation conductivity studied within the framework of Aslamazov–Larkin and Lawrence–Doniach theories fits well for 3D and 2D regimes with the appearance of critical region beyond 3D regime. Pseudogap temperature estimated above 100 K shifts to lower temperature zone as a function of ion doses. We report an enhancement of critical current density and flux pinning due to dual impact of swift heavy ion and Y2O3 inclusions at isothermal temperatures 40 K and 60 K.

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Acknowledgements

The authors would like to express a deep gratitude towards the Pelletron group for facilitating ion beam irradiation at IUAC, New Delhi and IOP Bhubaneswar, for providing magnetization measurements. This work was carried out under IUAC, New Delhi funded project.

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Authors and Affiliations

  1. Department of Physics, NIT, Rourkela, 769 008, India

    A. Kujur & D. Behera

  2. Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110 067, India

    K. Asokan

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  1. A. Kujur
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Kujur, A., Asokan, K. & Behera, D. Effect of Artificial Defects on Electric and Magnetic Transport Properties in YBa2Cu3O7−δ Thick Film. J Supercond Nov Magn 27, 1443–1450 (2014). https://doi.org/10.1007/s10948-014-2486-3

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